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Advances in Imaging and Electron Physics [Hardcover]

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  • Category: Books (Science)
  • ISBN-10:  0120147815
  • ISBN-10:  0120147815
  • ISBN-13:  9780120147816
  • ISBN-13:  9780120147816
  • Publisher:  Academic Press
  • Publisher:  Academic Press
  • Pages:  328
  • Pages:  328
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-2006
  • Pub Date:  01-Apr-2006
  • SKU:  0120147815-11-MPOD
  • SKU:  0120147815-11-MPOD
  • Item ID: 100711181
  • Seller: ShopSpell
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  • Delivery by: Dec 25 to Dec 27
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Retrieval of Shape from Silhouette (A. Bottino, A. Laurentini).
Projective Transforms on Periodic Discrete Image Arrays (A. Kingston, I. Svalbe).
Ray Tracing in Spherical Interfaces Using Geometric Algebra (Q.M. Sugon, Jr., D.J. McNamara).
Prolate Spheroidal Wave Functions and Wavelets (G.G. Walter).

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics &lƒ°

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