Compendium of Surface and Interface Analysis [Hardcover]

This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples.

Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.

Acoustic Microscopy.- Action Spectroscopy with STM.- Ambient Pressure X-ray Photoelectron Spectroscopy.- Angle-resolved Ultraviolet Photoelectron Spectroscopy.- Atom Probe Field Ion Microscope.- Atomic Force Microscope.- Auger electron spectroscopy.- Cathodoluminescence.- Conductive Atomic Force Microscopy.- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy.- Dynamic Secondary Ion Mass Spectrometry.- Elastic Recoil Detection Analysis.- Electrochemical Atomic Force Microscopy.- Electrochemical Infrared Spectroscopy.- Electrochemical Scanning Tunneling Microscopy.- Electrochemical Second Harmonic Generation.- Electrochemical Sum Frequency Generation.- Electrochemical Surface X-ray Scattering.- Electrochemical Transmission Electron Microscopy.- Electrochemical X-ray Absorption Fine Structure.- Electrochemical X-ray Photoelectron Spectroscopy.- Electron Backscatter Diffraction.- Electron Energy Loss Spectroscopy.- Electron Probe Microanalysis.- Electron Stimulated Desorption.- Electron-beam-induced current.- Ellipsometry.- Environmental SEM (Atmospheric SEM).- Environmental Transmission Electron Microscopy.- Extended X-ray Absorption Fine Structure.- Focused Ion Beam Scl“2