Crystallographic Instrumentation [Hardcover]

Innovations in crystallographic instrumentation and the rapid development of methods of diffraction measurement have led to a vast improvement in our ability to determine crystal and molecular structure. This up-to-date resource will allow the reader to harness the potential of X-ray diffraction instruments. Different sources of X-radiation used in crystallography are introduced, including synchrotron radiation, as well as a systematic review of detectors for X-rays and basic instruments for single crystal and powder diffractometry. The principles of the diffraction experiment are discussed and related to their practical application with a comparative description of different scan procedures. Diffraction data collection and processing are also reviewed and methods for error correction are described. This book will provide a useful guide for researchers and students starting in this area of science, as well as skilled crystallographers.

1. Radiation used in Crystallography
2. Principle of the Diffraction Experiment
3. Fundamental Techniques for X-ray Diffractometry
4. Single-crystal X-ray Diffractometry
5. Single Crystal Diffraction Data Collection and primary Processing
6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry
7. Defects in Crystals and their Influence on X-ray Structure Analysis
8. Auxiliary Methods
References
Subject Index
1. Radiation used in Crystallography
2. Principle of the Diffraction Experiment
3. Fundamental Techniques for X-ray Diffractometry
4. Single-crystal X-ray Diffractometry
5. Single Crystal Diffraction Data Collection and primary Procesing
6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry
7. Defects in Crystals and their Influence on X-ray Structure Analysis
8. Auxiliary Methods
References
Subject Index