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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs [Hardcover]

$87.99     $109.99   20% Off     (Free Shipping)
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  • Category: Books (Computers)
  • Author:  Noia, Brandon, Chakrabarty, Krishnendu
  • Author:  Noia, Brandon, Chakrabarty, Krishnendu
  • ISBN-10:  3319023772
  • ISBN-10:  3319023772
  • ISBN-13:  9783319023779
  • ISBN-13:  9783319023779
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  274
  • Pages:  274
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Mar-2013
  • Pub Date:  01-Mar-2013
  • SKU:  3319023772-11-SPRI
  • SKU:  3319023772-11-SPRI
  • Item ID: 100182684
  • List Price: $109.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Dec 01 to Dec 03
  • Notes: Brand New Book. Order Now.
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