Practical Materials Characterization [Hardcover]

Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.Covering the most common materials analysis techniques, this book reviews microstructural, surface, morphological and optical characterization of materials with emphasis on microscopic structural, electronic, biological and mechanical properties.

1. X-Ray Diffraction and Reflectivity.- 2. Introduction to Optical Characterization of Materials.- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).- 4. Secondary Ion Mass Spectrometry.- 5. Transmission Electron Microscopy.

Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Link?ping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc.

Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois.? She began working with SIMS in the early 1970's and continued until she retired inló&