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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photov [Paperback]

$252.99     $329.99   23% Off     (Free Shipping)
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  • Category: Books (Science)
  • Author:  Rein, Stefan
  • Author:  Rein, Stefan
  • ISBN-10:  3642064531
  • ISBN-10:  3642064531
  • ISBN-13:  9783642064531
  • ISBN-13:  9783642064531
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Feb-2010
  • Pub Date:  01-Feb-2010
  • SKU:  3642064531-11-SPRI
  • SKU:  3642064531-11-SPRI
  • Item ID: 105270651
  • List Price: $329.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Nov 25 to Nov 27
  • Notes: Brand New Book. Order Now.
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