This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP
?) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
The first single-source reference to all the major features of LEAP tomography, this volume includes a wealth of practical tips and covers all four core aspects of a LEAP tomography experiment from start to finish, as well as the software methods employed.
Preface
Acknowledgements
Foreword
Abbreviations
Chapter 1. History of APT and LEAP
1.1 Introduction
1.2 Ancestry of the Local Electrode Atom Probe
1.2.1 Early History and the Field Electron Emission Microscope (~1935)
1.2.2 Field Ion Microscope: The First Images of Atoms (1955)
1.2.3 Atom Probe Field Ion Microscope (1967)
1.2.4 The Advent of Atom Probe Tomography
1.2.5 The Position Sensitive Atom Probe (1988)
1.2.6 Electron Beam Pulsed Atom Probe
1.2.7 The Scanning Atom Probe
1.2.8 The Local Electrode Atom Probe (2001)
1.3 The State of Instrumentation
1.3.1 The Growth of the Local Electrode Atom Probe
1.3.2 Laser Pulsing
1.3.3 Fundamental Considerations for Design of Instrumentation
1.3.4 Reflectron-Based Instruments