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New Horizons of Applied Scanning Electron Microscopy [Hardcover]

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  • Category: Books (Technology &Amp; Engineering)
  • Author:  Shimizu, Kenichi, Mitani, Tomoaki
  • Author:  Shimizu, Kenichi, Mitani, Tomoaki
  • ISBN-10:  3642031595
  • ISBN-10:  3642031595
  • ISBN-13:  9783642031595
  • ISBN-13:  9783642031595
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Feb-2009
  • Pub Date:  01-Feb-2009
  • Pages:  179
  • Pages:  179
  • SKU:  3642031595-11-SPRI
  • SKU:  3642031595-11-SPRI
  • Item ID: 100842830
  • List Price: $109.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Nov 01 to Nov 03
  • Notes: Brand New Book. Order Now.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV.- Application Example 2: Z-Contrast Sensitivity in Low-Voltage, High-Angle BSE Imaging.- Application Example 3: Information Depth in Low-Voltage, High-Angle BSE Imaging.- Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications #x2013; Further Evidence for High Lateral Resolution in Low-Voltage, High-Angle BSE Imaging.- Application Example 5: A Thin Layer of Organic Contaminant on the Surface of Mirror-Polished Al-Based Hard Disks.- Application Example 6: A Further Potential of Ultralow-Voltage In-lens SE Imaging.- Application Example 7: Sample Surface Preparation by Ultramicrotomy Using a Diamond Knife for Cross-Sectional Examination of Various CoatlÓÏ

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