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Principles of Semiconductor Network Testing [Hardcover]

$87.99       (Free Shipping)
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  • Category: Books (Technology & Engineering)
  • Author:  Amir Afshar
  • Author:  Amir Afshar
  • ISBN-10:  0750694726
  • ISBN-10:  0750694726
  • ISBN-13:  9780750694728
  • ISBN-13:  9780750694728
  • Publisher:  Newnes
  • Publisher:  Newnes
  • Pages:  350
  • Pages:  350
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-1996
  • Pub Date:  01-Apr-1996
  • SKU:  0750694726-11-MPOD
  • SKU:  0750694726-11-MPOD
  • Item ID: 100862654
  • Seller: ShopSpell
  • Ships in: 2 business days
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  • Delivery by: Apr 09 to Apr 11
  • Notes: Brand New Book. Order Now.

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.



  • Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
  • Best new source of information for experienced semiconductor engineers as well as entry-level personnel
  • Eight chapters about semiconductor testing
Diode and transistor operation
Integrated circuit test basics
Digital logic test
Noise identification
Operational amplifier general information
Data acquisition devices
Digital signal processing
CODEC (Coder/Decoder)
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