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Reliability Of High-K / Metal Gate Field-Effect Transistors Considering Circuit [Paperback]

$34.99     $35.90    3% Off      (Free Shipping)
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  • Category: Books (Technology & Engineering)
  • Author:  Steve Kupke
  • Author:  Steve Kupke
  • ISBN-10:  3741208698
  • ISBN-10:  3741208698
  • ISBN-13:  9783741208690
  • ISBN-13:  9783741208690
  • Publisher:  Books on Demand
  • Publisher:  Books on Demand
  • Pages:  126
  • Pages:  126
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Jun-2016
  • Pub Date:  01-Jun-2016
  • SKU:  3741208698-11-MPOD
  • SKU:  3741208698-11-MPOD
  • Item ID: 106464220
  • List Price: $35.90
  • Seller: ShopSpell
  • Ships in: 2 business days
  • Transit time: Up to 5 business days
  • Delivery by: Dec 18 to Dec 20
  • Notes: Brand New Book. Order Now.
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