ShopSpell

Software Failure Investigation: A Near-Miss Analysis Approach [Hardcover]

$86.99     $109.99   21% Off     (Free Shipping)
100 available
  • Category: Books (Technology &Amp; Engineering)
  • Author:  Eloff, Jan, Bihina Bella, Madeleine
  • Author:  Eloff, Jan, Bihina Bella, Madeleine
  • ISBN-10:  3319613332
  • ISBN-10:  3319613332
  • ISBN-13:  9783319613338
  • ISBN-13:  9783319613338
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-2017
  • Pub Date:  01-Apr-2017
  • SKU:  3319613332-11-SPRI
  • SKU:  3319613332-11-SPRI
  • Item ID: 100886539
  • List Price: $109.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Nov 01 to Nov 03
  • Notes: Brand New Book. Order Now.

This book reviews existing operational software failure analysis techniques and proposes near-miss analysis as a novel, and new technique for investigating and preventing software failures. The authors provide details on how near-miss analysis techniques focus on the time-window before the software failure actually unfolds, so as to detect the high-risk conditions that can lead to a major failure. They detail how by alerting system users of an upcoming software failure, the detection of near misses provides an opportunity to collect at runtime failure-related data that is complete and relevant. They present a near-miss management systems (NMS) for detecting upcoming software failures, which can contribute significantly to the improvement of the accuracy of the software failure analysis. A prototype of the NMS is implemented and is discussed in the book. The authors give a practical hands-on approach towards doing software failure investigations by means of near-miss analysis that is of use to industry and academia

Chap1: Introduction.- Chap2: Software Failures: An Overview.- Chap3: Near-Miss Analysis: An Overview.- Chap4: A Methodology for Investigating Software Failures Using Digital Forensics and Near-Miss Analysis.- Chap5: A Well-Defined Model for Near-Miss Detection And Prioritisation.- Chap6: An Architecture for a Near-Miss System (Nms).- Chap7: Practical Demonstration of Conducting a Near-Miss Analysis Investigation for Software Failures.
Professor Jan Eloff graduated in 1985 with a PhD in Computer Science. Up to June 2015 he was appointed as the Research Director for SAP Research in Africa and is currently appointed as Deputy Dean Research & Postgraduate studies: Faculty of Eng., Built Environment and IT (EBIT) and as a full professor in computer science at the University of Pretoria. From 2007 he is an associate-editor of the Computers & Security journal and an editorial member for the international Computerlƒ7