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Statistical Aspects of Quality Control [Hardcover]

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  • Category: Books (Business & Economics)
  • Author:  Derman Cyrus, Sheldon M. Ross
  • Author:  Derman Cyrus, Sheldon M. Ross
  • ISBN-10:  0122100107
  • ISBN-10:  0122100107
  • ISBN-13:  9780122100109
  • ISBN-13:  9780122100109
  • Publisher:  Academic Press
  • Publisher:  Academic Press
  • Pages:  200
  • Pages:  200
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-1996
  • Pub Date:  01-Apr-1996
  • SKU:  0122100107-11-MPOD
  • SKU:  0122100107-11-MPOD
  • Item ID: 100890274
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On-line and off-line quality control are the two methods used to discern a products reliability of quality. Though they are disparate techniques, both methods are used to achieve the same result. This introductory textbook integrates the two techniques to present a wide coverage of statistical methods of quality control. The text is compact, stressing the key ideas and concepts rather than trying to cover each method in complete depth. Statistical Aspects of Quality Control is an excellent starting point for a student interested in learning more about the field of statistical quality control. References and suggested readings are included at the end of each chapter.

  • Presents statistical quality control in a compact fashion that stresses key ideas and concepts
  • Uses the concept of Average Run Length to compare the different control charts, such as Shewhart, moving average, and cusum
  • Introduces the Taguchi approach to quality design
  • Includes information on acceptance sampling
  • Concludes each chapter with final comments, references, and examples to illustrate the methods discussed
Introduction.
Elements of Probability.
Statistical Inference.
Off-Line Quality Control.
Shewhart Control Charts.
More General Control Charts.
Sampling Inspection by Attributes.
Sampling Inspection by Variables--A Loss FunctionApproach.
Subject Index.Dr. Sheldon M. Ross is a professor in the Department of Industrial and Systems Engineering at the University of Southern California. He received his PhD in statistics at Stanford University in 1968. He has published many technical articles and textbooks in the areas of statistics and applied probability. Among his texts are A First Course in Probability, Introduction to Probability Models, Stochastic Processes, and Introdul3�
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